穎崴科技股份有限公司-WLCSP Probe Card

The WLCSP probe card was designed to meet the needs of high-performance wafer probing. The probe provides short electrical length, high current resistance, and ease of maintenance and replacement. It can conduct function testing and error detection on a single chip through the precise manual lid design, optimizing IC functions before mass production. The current minimum spacing for testing is 0.12mm.