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WinWay's mmWave and AiP solution published in《Chip Scale Review》

SEP 30.2021
WinWay Technology Co., Ltd.

WinWay Technology published a recent technical article titled "Test Interface Solution for mmWave and AiP Applications" in the September-October 2021 issue of《Chip Scale Review》. For further details, please refer to the attached PDF file.Test interface solution for mmWave-WinWay_v1c.pdf

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