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穎崴科技股份有限公司-Vertical Probe Card

Wafer Test

Vertical Probe Card

Currently, to meet the trend of high-precision miniaturization, WinWay has created miniature probes for micro-electronic mechanical processing.

同軸式彈簧針測試座
同軸式彈簧針測試座
同軸式彈簧針測試座
同軸式彈簧針測試座

Information

Specifications

Pitch 200 ~ 80um
Tip Shape Flat / Point
C.C.C (A) 1.8 ~ 0.5A
Force 20 ~ 3g

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