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Characterization

Before the semiconductor devices released to product, the first step is to make sure the device function working properly by different tests methods including thermal / electrical / optical …. Through the help of characterization results of device function including I/O channels, signal quality, and supply noise.., it can analyze and detect potential signal and power integrity failures before the prototype phase. Therefore, users need a high performance test socket/Loadborad/tester and related sophisticated instruments to evaluate the semiconducting device to accommodate the various application requirements.

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