Home >> Application >> Application

Application
Characterization
Before the semi-conductor devices released to product, the first step is to make....
Wafer Test
Wafer testing is a verified procedure performed during semiconductor device fabr....
ATE
Automated Test Equipment (ATE) is any apparatus that performs tests on a semicon....
SLT
System-level tests consist of dozens of tests that are designed to fully exercis....

About us
Company Profile
Organization Structure
World Wide
Principle & Vision
Quality & Environmental Policy
Calendar of Events
Social Involvement
Products
High Performance Test Socket
Contact Element
Changeover Kit of Handler
CMOS Test Socket
High Performance Heat Sink/Manual Lid
ATC
Vertical Probe Cards
Test Engineering Center
2011©WinWay Tech. Co., Ltd. All rights reserved.
No. 68, Chuangyi S. Rd.,
Second District of Nanzih Export Processing Zone, Nanzih Dist., Kaohsiung City 81156, Taiwan (R.O.C.)
TEL: +886 7 3610999 FAX: +886 7 3610099
Visitors: 00649139