Product & Service
Total solution of semiconducting test service
Vertical Probe Card
WLCSP Probe Card
Socket & Lid
Brownie Coaxial Socket
Burn-in Socket
Thermal Control System
Package Test
Coaxial Socket
Delicate coaxial design for high speed test requirement (up to 56Gbps) and mixed signal applications (RF and Digital), Brownie coaxial socket is applicable from engineering characterization to mass production with pitch range from P1.0 to P0.35mm. The advantage of impedance control and negligible signal crosstalk are the features of coaxial socket design.
Wafer Test
Vertical Probe Card
Sophisticated with precision MEMS process on the fine pitch probe manufacturing is established for next generation probing requirement, while various probe alloys are verified for special conditions with minimum pitch 80um. We are devoted to developing the cost-effective and performance oriented vertical probe solution.
Thermal Control System
ATC
ATC is an active thermal unit to control the IC’s testing temperature by using long life thermoelectric chip with circulating fluid as cooling medium.
